Hitachi AFM5010
Probe Station
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Nanocute exclusive next generation control station for the latest SPM
technology. Applicable measurement mode is limited compared to the standard
station.
Specifications
| Real Tune Function |
Standard equipped |
|
| X･Y Scan Voltage |
±200V/18bit |
| Z Scan Voltage |
±200V/21bit |
|
| Rectangular Scan |
1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1 |
|
| Function |
- Auto Gain Control
- Z Scan Limiter
|
|
| Software |
- Easy menu
- Superimpose Image (Shape/Property)
- 2 Signal Force Curve Measurement
- Auto Measurement Recipe Function
- Data Analysis Batch Processing Function
- 3D Display Function
- Surface Roughness Analysis (Rms, Ra, Rms, Elevation Difference, Surface Area)
- Cross-section Analysis, Average Cross-section Analysis
- Multi-Function Simultaneous Cross-section Analysis (2 to 4 data support)
- Surface Roughness JIS Standard (JIS R 1683：2007)
- Probe Evaluation Function
- Line Editor Function
|
- Auto Cross-section Analysis (Groove width, Pitch, Angle Analysis)
- Morphology Filter Function
- Particle Analysis Function (Particle diameter, Particle surface, Particle number)
|
| OS |
Windows® 7 |
|
