Hitachi AFM5300E
Environmental AFM Control Unit
An environment control type probe microscope (SPM) that supports various measurement environments including air, vacuum, and liquids. In addition to observing shape or properties of material surfaces in various temperature environments, it is able to use a surface change temperature monitor function to quantitatively evaluate changes in surface properties by a process that continuously changes temperatures.
Specifications
| Detection system | Low coherent optic lever method 4 part transition detection system | |
| Resolution | Atomic resolution | |
| Sample size | 20mmφ, thickness 10mm | |
| Sample drive range | X-Y Stage 5mm | |
| Scan range | Standard: 20 um x 20um/1.5 umH | 150 umx 150um/5 umH 15 um x 15um/1.5 umH (Closed system) |
| Positioning microscope | Simple microscope (×200 mag) Optic microscope (×1000 mag) Zoom microscope (×700 mag) Metal microscope (with differential interference) ()×2000 mag) |
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| Measurement functions | AFM (Contact) DFM PM (Phase) FFM (Friction) MFM (Magnetic force) |
SIS mode LM-FFM (Traverse vibration friction) VE-AFM/DFM (visco-elasticity) Adhesion (absorption force) CURRENT SSRM (Spread resistance） SNDM PRM (piezo-electric response) KFM (Surface phase) AFM/DFM in solution EC-AFM/STM (Electrochemistry) NanoIndentation (Hardness) Nano-TA (nano-thermal) |